| 01 | Constant Current Power Supply |
| 02 | Constant Current Source |
| 03 | Cryostat Unit –190°C to 200°C |
| 04 | D.C. Micro Voltmeter |
| 05 | Determination of Planck’s Constant by LED Method |
| 06 | Dielectric Constant of Liquids |
| 07 | Dielectric Constant of Solids & Liquids |
| 08 | Dielectric Measurement Setup |
| 09 | Digital D.C. Micro Voltmeter |
| 10 | Digital Gauss Meter |
| 11 | Digital Nano Ammeter |
| 12 | Digital Pico Ammeter |
| 13 | Electromagnet |
| 14 | Four Probe Method for Very Low to High Resistivity Samples up to 200°C (PID Controlled) |
| 15 | Four Probe Set-up with Thermocouple Sensor |
| 16 | Four Probe Setup for Mapping Resistivity of Large Samples |
| 17 | Four Probe Setup for Resistivity –190°C to 200°C |
| 18 | Four Probe Setup with X-Y Movement |
| 19 | Frank Hertz Experiment |
| 20 | Frequency Dependence of Dielectric Constant |
| 21 | Hand Held Gauss Meter |
| 22 | Hall Probe Multipurpose Stand |
| 23 | High Performance PID Controller |
| 24 | High Voltage Power Supply |
| 25 | Ionisation Potential Setup |
| 26 | Low Current Source |
| 27 | Magnetic Field Measurement Apparatus |
| 28 | Magneto-Resistance Setup |
| 29 | Measurement of Magneto Resistance in Bismuth |
| 30 | Measurement of Magneto Resistance in Different Samples (n-type Ge) |
| 31 | Measurement of Magneto Resistance of Semiconductors |
| 32 | Millikan’s Oil Drop Experiment |
| 33 | Oven Unit (up to 200°C) |
| 34 | PID Controlled Oven |
| 35 | Planck’s Constant by Photoelectric Effect |
| 36 | Resistivity of Semiconductors by Four Probe Method at Different Temperatures |
| 37 | Standard Samples: Ge, Si, Aluminium |
| 38 | Study of Dielectric Constant & Curie Temperature of Ferroelectric Ceramics |
| 39 | Travelling Microscope |
| 40 | Two Probe Method for Resistivity of Insulators (up to 10¹³ W·cm) |
| 41 | Two Probe Method with USB-Based Computer Interface |
| 42 | X-Ray Diffraction Simulation Experiment |
| 43 | Zeeman Effect Experiment |